Research Area

Semiconductor thin film/nanopattern high-speed photometric technology, Integrated Metrology: a Machine Learning-Based Semiconductor Process, High sensitivity biosensing technology

Phone

063-270-4632

E-mail

dashi.kim@jbnu.ac.kr

Web-site

http://www.norilab.com

Subjects in charge

Mechanical System Engineering Experiment, Introduction to Creative Engineering Design, Introduction to Electrical and Electronic Engineering, Capstone Design

Office

Engineering College Building 4, Room 317

Laboratory

Optical Metrology Lab